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Attention-based Semi-supervised Partial Label Learning on Web Image Classification

  • Dayuan Chen
  • , Ying Ma*
  • *Corresponding author for this work
  • Xiamen University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Partial label learning s a type of weakly supervised learning, which learns to predict one label as the correct answer from a given candidate label set. It is a great challenge to improve the accuracy of recognition because of the combination of the two difficult learning conditions, partial supervised learning and partial supervised learning. However, these methods all use similar matrices for tag propagation. We introduced the attention mechanism, proposed a attention-based semi-supervised partial label learning (ASPLL) method to address the label contamination issue in PLL through reliable label propagation. Using attention mechanism instead of similarity matrix can significantly improve the accuracy of the algorithm. We evaluate the performance of our method on real-world web image datasets. The experimental results on the web image dataset show that in the semi supervised partial labeling web image classification, ASSPL algorithm is significantly better than the mainstream semi-supervised partial labeling learning algorithms, such as SSPL, PARM.

Original languageEnglish
Title of host publicationThird International Conference on Artificial Intelligence and Electromechanical Automation, AIEA 2022
EditorsShuangming Yang
PublisherSPIE
ISBN (Electronic)9781510657281
DOIs
StatePublished - 2022
Externally publishedYes
Event3rd International Conference on Artificial Intelligence and Electromechanical Automation, AIEA 2022 - Changsha, China
Duration: 8 Apr 202210 Apr 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12329
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference3rd International Conference on Artificial Intelligence and Electromechanical Automation, AIEA 2022
Country/TerritoryChina
CityChangsha
Period8/04/2210/04/22

Keywords

  • Partial label learning
  • attention mechanism
  • semi-supervised learning

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