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Application of multivalued test sequencing to fault diagnosis

  • Wei Wang*
  • , Qing Hua Hu
  • , Daren Yu
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we consider a multivalued test sequencing (MVTS) problem, in which a test may have an arbitrary number of possible outcomes denoting different behaviors. The multivalued test sequencing problem can be solved through dynamic programming to find the optimal test sequence, but the time and space is large. In order to deal with this problem, we propose multivalued AO* algorithm, called MVAO*, based on multivalued heuristic evaluation function (MVHEF) in the AO*. With one example we demonstrate that MVAO* is efficient and effective for optimizing test sequences problem with multiple test responses.

Original languageEnglish
Title of host publication2007 8th International Conference on Electronic Measurement and Instruments, ICEMI
Pages4737-4740
Number of pages4
DOIs
StatePublished - 2007
Event2007 8th International Conference on Electronic Measurement and Instruments, ICEMI - Xian, China
Duration: 16 Aug 200718 Aug 2007

Publication series

Name2007 8th International Conference on Electronic Measurement and Instruments, ICEMI

Conference

Conference2007 8th International Conference on Electronic Measurement and Instruments, ICEMI
Country/TerritoryChina
CityXian
Period16/08/0718/08/07

Keywords

  • Fault diagnosis
  • Heuristic search
  • Test sequencing

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