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Application of fuzzy expert system in defect inspection of TFT-LCD

  • Yu Zhang*
  • , Jian Zhang
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

A fuzzy expert system for defect inspection of TFT-LCD is proposed. Because the defects of TFT-LCD are of strong complexity and vagueness, it is very difficult to establish accurate mathematical models for the defects. Combining expert system with fuzzy set theory, the defect inspection system could make good use of expert experience and knowledge to solve the problem of vagueness and uncertainty which is existed in the process of defect inspection without complex mathematical models. The results show that the rates of both miss and false detection are lower than 3% and can meet the expected requirement.

Original languageEnglish
Pages (from-to)719-723
Number of pages5
JournalGuangdianzi Jiguang/Journal of Optoelectronics Laser
Volume17
Issue number6
StatePublished - Jun 2006

Keywords

  • Fuzzy expert system
  • Mura
  • TFT-LCD
  • Visual defect

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