Application of atomic force microscopy in the field of polymer film

Several application techniques of atomic force microscopy (AFM) in the field of polymer film were introduced in this article. When observing the films in fixed position, relocation methods using carbon nanotubes and tip scratching can be used to re-position the same location precisely after the sample was treated by ex-situ. When measuring the thickness of polymer film, some methods such as tip scratching or floating film can be adopted to prepare section step, and the thic kness can be measured precisely by AFM. Basing on the block copolymer thin film with special phase separation microstructure, AFM tip can be used to forge nanop atterns on the film surface. Those techniques broaden the application of AFM in the field of charactering polymer thin film and nanofabrication.