Abstract
This article presents the application of GO methodology in the reliability analysis of synthetical simulated experiment system of railway electronic antiskid devices. By using this method, the reliability characteristics for the quantity of each testing system usable degree, the failure rate can be derived directly from the GO graph. This method also solves the practical problem of the reliability parameter calculation with shared signals. This article also provides the example in the whole testing system. The result shows that the GO methodology is very simple and useful in the reliability analysis of the repairable system.
| Original language | English |
|---|---|
| Pages (from-to) | 95-101 |
| Number of pages | 7 |
| Journal | Xitong Gongcheng Lilun yu Shijian/System Engineering Theory and Practice |
| Volume | 26 |
| Issue number | 10 |
| State | Published - Oct 2006 |
| Externally published | Yes |
Keywords
- Failure rate
- GO methodology
- Reliability
- Repairable system
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