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Anomaly detection in analog circuits using Support Vector Data Description

  • Harbin Institute of Technology
  • Machine Engineering College

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the rapid development of electronic technology, electronic systems are widely used in various fields, and the reliability requirement for electronic systems is also increasing. Many test and diagnosis methods have been proposed. However, few methods can be used to recognize the intermediate anomaly state between normal and fault state. To solve the above problem, this paper presents an anomaly detection method based on Support Vector Data Description (SVDD) for analog circuits. Simulation and experiments have verified the effectiveness.

Original languageEnglish
Title of host publicationIEEE AUTOTESTCON 2016, AUTOTESTCON 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509007899
DOIs
StatePublished - 12 Oct 2016
Event52nd IEEE AUTOTESTCON 2016, AUTOTESTCON 2016 - Anaheim, United States
Duration: 12 Sep 201615 Sep 2016

Publication series

NameAUTOTESTCON (Proceedings)
Volume2016-October

Conference

Conference52nd IEEE AUTOTESTCON 2016, AUTOTESTCON 2016
Country/TerritoryUnited States
CityAnaheim
Period12/09/1615/09/16

Keywords

  • Anomaly detection
  • SVDD
  • analog circuits

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