Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

Deyun Chen; Guibin Zheng; Xiaoyang Yu; Yukun Wang; Tong Zhou

doi:10.1117/12.453006

Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

Deyun Chen^*
, Guibin Zheng
, Xiaoyang Yu
, Yukun Wang
, Tong Zhou

^*Corresponding author for this work

Harbin University of Science and Technology

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

This paper describes a tomographic method is based on 8-electrode capacitance sensor. It discusses the application of finite element method in electrical capacitance tomography, and a finite element model of 8-electrode capacitance sensor is established. Capacitance sensitivity distributions can be analyzed with this method. Satisfactory images can be reconstructed by using the capacitance sensitivity distributions as a priori information. It provides powerful support for further application research.

Original language	English
Pages (from-to)	355-359
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4663
DOIs	https://doi.org/10.1117/12.453006
State	Published - 2002
Externally published	Yes
Event	Color Imaging: Device-Independent Color, Color Hardcopy, and Applications VII - San Jose, CA, United States Duration: 22 Jan 2002 → 25 Jan 2002

Keywords

Capacitance sensitivity distributions
Electrical capacitance tomography
Finite element method
Image reconstruction

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10.1117/12.453006

Cite this

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title = "Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography",

abstract = "This paper describes a tomographic method is based on 8-electrode capacitance sensor. It discusses the application of finite element method in electrical capacitance tomography, and a finite element model of 8-electrode capacitance sensor is established. Capacitance sensitivity distributions can be analyzed with this method. Satisfactory images can be reconstructed by using the capacitance sensitivity distributions as a priori information. It provides powerful support for further application research.",

keywords = "Capacitance sensitivity distributions, Electrical capacitance tomography, Finite element method, Image reconstruction",

author = "Deyun Chen and Guibin Zheng and Xiaoyang Yu and Yukun Wang and Tong Zhou",

year = "2002",

doi = "10.1117/12.453006",

language = "英语",

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journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - JOUR

T1 - Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

AU - Chen, Deyun

AU - Zheng, Guibin

AU - Yu, Xiaoyang

AU - Wang, Yukun

AU - Zhou, Tong

PY - 2002

Y1 - 2002

N2 - This paper describes a tomographic method is based on 8-electrode capacitance sensor. It discusses the application of finite element method in electrical capacitance tomography, and a finite element model of 8-electrode capacitance sensor is established. Capacitance sensitivity distributions can be analyzed with this method. Satisfactory images can be reconstructed by using the capacitance sensitivity distributions as a priori information. It provides powerful support for further application research.

AB - This paper describes a tomographic method is based on 8-electrode capacitance sensor. It discusses the application of finite element method in electrical capacitance tomography, and a finite element model of 8-electrode capacitance sensor is established. Capacitance sensitivity distributions can be analyzed with this method. Satisfactory images can be reconstructed by using the capacitance sensitivity distributions as a priori information. It provides powerful support for further application research.

KW - Capacitance sensitivity distributions

KW - Electrical capacitance tomography

KW - Finite element method

KW - Image reconstruction

UR - https://www.scopus.com/pages/publications/0036406556

U2 - 10.1117/12.453006

DO - 10.1117/12.453006

M3 - 会议文章

AN - SCOPUS:0036406556

SN - 0277-786X

VL - 4663

SP - 355

EP - 359

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Color Imaging: Device-Independent Color, Color Hardcopy, and Applications VII

Y2 - 22 January 2002 through 25 January 2002

ER -

Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

Abstract

Keywords

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