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Analysis of Accelerated Performance Degradation of Transformer in Thermal-Electrical and Thermal-Humidity Aging Conditions

  • Beijing Aerospace Automatic Control Institute
  • Ltd.
  • School of Electronics and Information Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The reliability of DC transformers is crucial for the safety and stability of DC microgrids. Aging of solder joints and insulation materials in high-temperature and high-humidity environments will pose significant risks to the reliability of transformers. This study investigated the aging performance of a specific DC-DC transformer module using step-stress accelerated life tests (SSALT), which offers advantages in sample amount and testing time compared to constant-stress tests. Thermal-electrical SSALT was conducted at 125°C, 150°C and 175°C, and thermal-humidity SSALT was conducted at 85°C, 65%/85%/95% RH. Output voltage deviation was used as the failure criterion. Degradation data achieved from the thermal-electrical and thermal-humidity SSALT were fitted to calculate degradation rates according to Arrhenius model and Eyring model, respectively. Besides, the activation energy and acceleration factor for transformer aging were also calculated accordingly. Life predictions indicated times to parametric drift failure under normal conditions. The results demonstrated the effectiveness of SSALT and the developed models for predicting transformer life under thermal and humid conditions.

Original languageEnglish
Title of host publicationProceedings of 2025 IEEE 7th International Conference on Civil Aviation Safety and Information Technology, ICCASIT 2025
EditorsHuabo Sun
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages321-326
Number of pages6
ISBN (Electronic)9798331503741
DOIs
StatePublished - 2025
Event7th IEEE International Conference on Civil Aviation Safety and Information Technology, ICCASIT 2025 - Yinchuan, China
Duration: 22 Oct 202524 Oct 2025

Publication series

NameProceedings of 2025 IEEE 7th International Conference on Civil Aviation Safety and Information Technology, ICCASIT 2025

Conference

Conference7th IEEE International Conference on Civil Aviation Safety and Information Technology, ICCASIT 2025
Country/TerritoryChina
CityYinchuan
Period22/10/2524/10/25

Keywords

  • DC transformer
  • life prediction
  • reliability
  • step-stress accelerated life test(SSALT)

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