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An novel location technology based on SIFT features matching

  • Tao Hu
  • , Yong Zhao*
  • *Corresponding author for this work
  • Northeastern University China

Research output: Contribution to journalArticlepeer-review

Abstract

In target positioning system, which is based on the matching of local characteristic points, the proportion of false matching points directly impacts positioning precision. In traditional SIFT method, in order to guarantee there are enough matching points during the matching process, usually a minor statistic field is selected. But this results in false matching because it loses relevance of surrounding fields. In order to improve the accuracy of positioning, this paper presents an improved SIFT characteristic descriptor, which introduces PCA statistic characteristics into traditional SIFT local descriptors. In this way, a higher correct matching ratio is obtained. Traditional filtering algorithm of SIFT false matching (e.g. NN method) loses too much correct matching while filtering out the false ones. To further reduce the false matches, this paper proposes a second filtering which is based on the NN method, using the matching points' coordinate information. Experiments show that this positioning method's precision is better than traditional ones.

Original languageEnglish
Pages (from-to)3385-3388
Number of pages4
JournalOptik
Volume125
Issue number14
DOIs
StatePublished - Jul 2014

Keywords

  • Feature matching
  • Principal component analysis
  • Target location

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