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An improved particle information extraction method for laser interference particle imaging technology

  • Yarui Ma
  • , Jiwen Cui*
  • , Hui Wang
  • , Jiubin Tan
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The laser interferometric particle imaging technology is used to irradiate the particle spray field with flaky laser beams and collect the scattered light images of the particles on the defocus surface of the imaging lens with a high-speed CCD camera. Based on the existing laser interference particle imaging measurement methods, this paper proposes an automatic recognition algorithm of interference fringe pattern based on morphology Hough transform and a fringe frequency extraction algorithm based on Fourier transform. The overlapping particles are accurately recognized through the improved particle interference fringe pattern recognition algorithm, so as to improve the particle measurement accuracy. Two algorithms are used to simulate and analyze the basic circle and interference fringes, the correct center coordinates and fringe frequency are obtained, and the interference particle images in particle fields with different concentrations are simulated and verified.

Original languageEnglish
Title of host publicationTenth International Symposium on Precision Mechanical Measurements
EditorsHaojie Xia, Lian X. Yang, Liandong Yu
PublisherSPIE
ISBN (Electronic)9781510649934
DOIs
StatePublished - 2021
Event10th International Symposium on Precision Mechanical Measurements - Qingdao, China
Duration: 15 Oct 202117 Oct 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12059
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference10th International Symposium on Precision Mechanical Measurements
Country/TerritoryChina
CityQingdao
Period15/10/2117/10/21

Keywords

  • Hough transform
  • IPI measurement method
  • Interference fringe pattern
  • Particle information extraction
  • Particle measurement

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