An evaluation method for nanoscale wrinkle

Y. P. Liu; C. G. Wang; L. M. Zhang; H. F. Tan

doi:10.1016/j.physe.2016.02.007

An evaluation method for nanoscale wrinkle

Y. P. Liu
, C. G. Wang^*
, L. M. Zhang
, H. F. Tan

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling.

Original language	English
Pages (from-to)	191-194
Number of pages	4
Journal	Physica E: Low-Dimensional Systems and Nanostructures
Volume	80
DOIs	https://doi.org/10.1016/j.physe.2016.02.007
State	Published - Jun 2016

Keywords

Spectrum analysis
Thin film
Wrinkle
Wrinkling wavelength

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10.1016/j.physe.2016.02.007

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title = "An evaluation method for nanoscale wrinkle",

abstract = "In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6\%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling.",

keywords = "Spectrum analysis, Thin film, Wrinkle, Wrinkling wavelength",

author = "Liu, \{Y. P.\} and Wang, \{C. G.\} and Zhang, \{L. M.\} and Tan, \{H. F.\}",

year = "2016",

month = jun,

doi = "10.1016/j.physe.2016.02.007",

language = "英语",

volume = "80",

pages = "191--194",

journal = "Physica E: Low-Dimensional Systems and Nanostructures",

issn = "1386-9477",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - An evaluation method for nanoscale wrinkle

AU - Liu, Y. P.

AU - Wang, C. G.

AU - Zhang, L. M.

AU - Tan, H. F.

PY - 2016/6

Y1 - 2016/6

N2 - In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling.

AB - In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling.

KW - Spectrum analysis

KW - Thin film

KW - Wrinkle

KW - Wrinkling wavelength

UR - https://www.scopus.com/pages/publications/84958149286

U2 - 10.1016/j.physe.2016.02.007

DO - 10.1016/j.physe.2016.02.007

M3 - 文章

AN - SCOPUS:84958149286

SN - 1386-9477

VL - 80

SP - 191

EP - 194

JO - Physica E: Low-Dimensional Systems and Nanostructures

JF - Physica E: Low-Dimensional Systems and Nanostructures

ER -

An evaluation method for nanoscale wrinkle

Abstract

Keywords

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