@inproceedings{6fa2b3a66a7b48539a0ecf9a0a6dde03,
title = "An error correction code for use in space vehicle computers",
abstract = "Memory cells of space vehicle computers generate errors in their stored data because of radiation. The main reason of the error is single event upset (SEU). Hamming code which has Capability of correcting one bit and detecting two bits is usually used in space vehicles to secure the memory data. As the density of the memory is more and more high, the possibility of multiple bits upset (MBU) increase and hamming code may be inadequate. In this paper, a (15,8) code is presented which can correct all double-adjacent errors and triple-adjacent errors in addition to signal error correction (SEC) and double error detection (DED). It is a powerful and efficient solution to SEU and MBU.",
keywords = "Adjacent error correction, Error correction code, Memory application, Space vehicle computer",
author = "Huang, \{R. N.\} and B. Gong and Lou, \{Y. J.\}",
year = "2012",
doi = "10.4028/www.scientific.net/AMM.121-126.3784",
language = "英语",
isbn = "9783037852828",
series = "Applied Mechanics and Materials",
pages = "3784--3788",
booktitle = "Frontiers of Manufacturing and Design Science II",
note = "2nd International Conference on Frontiers of Manufacturing and Design Science, ICFMD 2011 ; Conference date: 11-12-2011 Through 13-12-2011",
}