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An electrical contact resistance model including roughness effect for a rough MEMS switch

  • University of California at San Diego
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Understanding the contact behavior of a microelectromechanical system (MEMS) switch is of great importance to reach a high-reliability level for micro-switch applications. The deformation occurring at the many a-spots produced by the mechanical contact of asperities can be elastic, elastic-plastic, fully plastic or any combination of the three types of deformation and has a strong effect on the contact resistance. This work presents an electrical contact resistance model for a rough MEMS switch. A dimensionless parameter k, which is a function of the electron mean free path and the roughness parameters of contacting surfaces, is introduced to identify the contact resistance. The results show that the dimensionless contact resistance is a strong function of the dimensionless contact load, the plasticity index ψ and the parameter k. The theoretical results are in good agreement with some of the experimental results.

Original languageEnglish
Article number115023
JournalJournal of Micromechanics and Microengineering
Volume22
Issue number11
DOIs
StatePublished - Nov 2012

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