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An Effective Uncorrectable Memory Error Prediction Framework by Exploiting UPH Indicators in Production Environments

  • Xiaobo Zheng
  • , Lisha Qin
  • , Shiyi Li*
  • , Wen Xia
  • , Chentao Wu
  • , Yunfei Gu
  • , Qicong Lin
  • , Jun Wan
  • , Huifang Jiao
  • , Rubing Huang
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • Huazhong University of Science and Technology
  • Shanghai Jiao Tong University
  • Huawei Technologies Co., Ltd.
  • Macau University of Science and Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

UCEs (Uncorrectable memory errors) pose significant challenges to cloud computing systems, often resulting in catastrophic failures and crashes. Researchers have explored prediction approaches to address this issue. Previous studies have provided insights into memory error prediction, focusing on memory module part numbers and relationships between error code data. However, these efforts face challenges due to insufficient data features and suboptimal optimization, especially in production environments where hardware/software sparing techniques are widely deployed, the UCE ratio is low, and long lead time is required. To address these issues, our study first collect a large amount of memory data from different vendors in Huawei's production environment, which has deployed hardware/software sparing techniques, to provide more general data. Second, we exploit new indicators termed UPH (Unique, Pinx, and History) from this data, which play a crucial role in predicting UCEs. UPH offers a more profound understanding of the factors contributing to UCEs and demonstrates higher precision and recall. Then, we integrate existing indicators and UPH into our prediction framework and demonstrate the significance of UPH through indicator importance assessments. We also optimize the framework by determining an optimal sampling window. In production environments with long lead time and low UCE ratio, we improve the framework by implementing noise reduction, self-history learning, and a new scenario-based model selection approach. Experimental results demonstrate 19% - 27% increase in UCE prediction recall with 4%-11% increase in precision under different scenarios, outperforming state-of-the-art methods in production environments.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE International Parallel and Distributed Processing Symposium, IPDPS 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1238-1248
Number of pages11
Edition2025
ISBN (Electronic)9798331532376
DOIs
StatePublished - 2025
Externally publishedYes
Event39th IEEE International Parallel and Distributed Processing Symposium, IPDPS 2025 - Milan, Italy
Duration: 3 Jun 20257 Jun 2025

Conference

Conference39th IEEE International Parallel and Distributed Processing Symposium, IPDPS 2025
Country/TerritoryItaly
CityMilan
Period3/06/257/06/25

Keywords

  • UCE prediction
  • memory errors
  • memory reliability
  • production environment

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