TY - GEN
T1 - An automated fault injection technique based on VHDL syntax analysis and stratified sampling
AU - Sheng, Weiguang
AU - Xiao, Liyi
AU - Mao, Zhigang
PY - 2008
Y1 - 2008
N2 - Soft errors, a concern for space applications in the past, became a critical issue in deep sub-micron VLSI design for the continuous technology scaling. An automated fault injection technique is employed to characterise the recovery coverage and soft error sensitivity of the VHDL based design. Lexical and syntax analysis technique is developed to perform automated fault injection task. Stratified sampling technique is used to reduce the fault injection overheads. A fault injector, HSECT (HIT Soft Error Characterization Toolkit) is developed and 3,000 soft errors are injected into a simple RISC processor, DP32-processor. The recovery coverage and soft error sensitivity of the processor are also further investigated to direct the future design of the faulttolerant and dependable circuit.
AB - Soft errors, a concern for space applications in the past, became a critical issue in deep sub-micron VLSI design for the continuous technology scaling. An automated fault injection technique is employed to characterise the recovery coverage and soft error sensitivity of the VHDL based design. Lexical and syntax analysis technique is developed to perform automated fault injection task. Stratified sampling technique is used to reduce the fault injection overheads. A fault injector, HSECT (HIT Soft Error Characterization Toolkit) is developed and 3,000 soft errors are injected into a simple RISC processor, DP32-processor. The recovery coverage and soft error sensitivity of the processor are also further investigated to direct the future design of the faulttolerant and dependable circuit.
UR - https://www.scopus.com/pages/publications/50649115749
U2 - 10.1109/DELTA.2008.36
DO - 10.1109/DELTA.2008.36
M3 - 会议稿件
AN - SCOPUS:50649115749
SN - 0769531105
SN - 9780769531106
T3 - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
SP - 587
EP - 591
BT - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
T2 - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Y2 - 23 January 2008 through 25 January 2008
ER -