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An analysis and performance assessment of double EWMA control systems

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Run-to-run (RtR) control technology has received tremendous interest in semiconductor manufacturing industry. Exponentially weighted moving average (EWMA), double EWMA controllers are recognized most popular control schemes for RtR control. In this paper, stability analysis of double EWMA control system is examined in control theory. The novelty of this work is that an iterative method is developed to obtain the best achievable performance of the double EWMA control system. The performance of double EWMA control system is evaluated and the discount factors are retuned. Simulation example is given to show the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings of the 33rd Chinese Control Conference, CCC 2014
EditorsShengyuan Xu, Qianchuan Zhao
PublisherIEEE Computer Society
Pages2985-2989
Number of pages5
ISBN (Electronic)9789881563842
DOIs
StatePublished - 11 Sep 2014
EventProceedings of the 33rd Chinese Control Conference, CCC 2014 - Nanjing, China
Duration: 28 Jul 201430 Jul 2014

Publication series

NameProceedings of the 33rd Chinese Control Conference, CCC 2014
ISSN (Print)1934-1768
ISSN (Electronic)2161-2927

Conference

ConferenceProceedings of the 33rd Chinese Control Conference, CCC 2014
Country/TerritoryChina
CityNanjing
Period28/07/1430/07/14

Keywords

  • Run-to-run control
  • best achievable performance (BAP)
  • double exponentially weighted moving average (EWMA)
  • performance assessment

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