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Ambiguity function used for detection of confocal microscope

  • Xiangdong Huang*
  • , Jiubin Tan
  • , Jiaxing Zhu
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the conventional confocal microscope, the alignment of physical pinholes is an important problem. In this paper, a digital pinhole filter based on image restoration is investigated for the confocal microscope. Firstly, we discuss the properties of ambiguity function. Next, we use it to build the off-focus point spread function (PSF). Then, we use image restoration technique based on inverse filtering method to reject out-of-focus light in order to improve the depth resolution. Experimental results indicate that the method can reduce the pixel crosstalk resulting from out-of-focus light, and the alignment of pinholes can be made easy.

Original languageEnglish
Title of host publication2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010
DOIs
StatePublished - 2010
Event2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010 - Guangzhou, China
Duration: 3 Dec 20106 Dec 2010

Publication series

Name2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010

Conference

Conference2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010
Country/TerritoryChina
CityGuangzhou
Period3/12/106/12/10

Keywords

  • Confocal
  • Digital pinhole
  • Out-of-focus light
  • Virtual pinhole

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