Abstract
The un-doped and Mn doped ZnO thin films, with oxygen rich stoichiometry, were deposited onto Si (1 0 0) substrate using spin coating technique. The structural analysis revealed the hexagonal wurtzite structure without any impurity phase formation. A consistent increase in cell volume with the increase in Mn doping concentration confirmed the successful incorporation of bigger sized tetrahedral Mn 2+ ions (0.83 ) in ZnO host matrix that was also endorsed by the presence of Mn 2p 3/2 core level XPS spectroscopic peak. Extended deep level emission (DLE) spectra centered at ∼627 nm confirmed the presence of oxygen interstitials. Moreover, the magnetic measurements of field dependent M-H curves revealed the origin of ferromagnetic ordering from Mn-defect pair exchange coupling with oxygen interstitials in ZnO host matrix.
| Original language | English |
|---|---|
| Pages (from-to) | 6373-6378 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 258 |
| Issue number | 17 |
| DOIs | |
| State | Published - 15 Jun 2012 |
| Externally published | Yes |
Keywords
- Dilute magnetic semiconductors (DMS)
- Oxygen interstitials
- Room temperature ferromagnetism (RTFM)
- Spin coating technique
- ZnO:Mn thin films
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