TY - GEN
T1 - Adapting LLM to Generate Vulnerability Descriptions and Repair Suggestions
AU - Tao, Wenxin
AU - Ke, Yekun
AU - Dong, Zhaohui
AU - Li, Yanlong
AU - Su, Xiaohong
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Software vulnerabilities pose serious threats to the security of modern software systems. Existing detection tools can flag or pinpoint vulnerability but offer little guidance on how to fix them. In this paper, we leverage the generative and reasoning strengths of LLMs to bridge this gap, combining prompt tuning, retrieval-augmented generation, and chain-of-thought techniques to produce both clear vulnerability descriptions and concrete repair suggestions. We evaluated five mainstream LLMs on the BigVul dataset, and the combination of RAG and CoT methods achieves leading performance across multiple metrics in both the vulnerability description generation and repair suggestion generation tasks.
AB - Software vulnerabilities pose serious threats to the security of modern software systems. Existing detection tools can flag or pinpoint vulnerability but offer little guidance on how to fix them. In this paper, we leverage the generative and reasoning strengths of LLMs to bridge this gap, combining prompt tuning, retrieval-augmented generation, and chain-of-thought techniques to produce both clear vulnerability descriptions and concrete repair suggestions. We evaluated five mainstream LLMs on the BigVul dataset, and the combination of RAG and CoT methods achieves leading performance across multiple metrics in both the vulnerability description generation and repair suggestion generation tasks.
KW - Chain of Thought
KW - Large Language Model
KW - Retrieval-Augmented Generation
KW - Software Security
KW - Vulnerability Repair
UR - https://www.scopus.com/pages/publications/105015454443
U2 - 10.1109/SEAI65851.2025.11108759
DO - 10.1109/SEAI65851.2025.11108759
M3 - 会议稿件
AN - SCOPUS:105015454443
T3 - 2025 IEEE 5th International Conference on Software Engineering and Artificial Intelligence, SEAI 2025
SP - 184
EP - 188
BT - 2025 IEEE 5th International Conference on Software Engineering and Artificial Intelligence, SEAI 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th IEEE International Conference on Software Engineering and Artificial Intelligence, SEAI 2025
Y2 - 20 June 2025 through 22 June 2025
ER -