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Active learning for software defect prediction

  • Guangchun Luo*
  • , Ying Ma
  • , Ke Qin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

An active learning method, called Two-stage Active learning algorithm (TAL), is developed for software defect prediction. Combining the clustering and support vector machine techniques, this method improves the performance of the predictor with less labeling effort. Experiments validate its effectiveness.

Original languageEnglish
Pages (from-to)1680-1683
Number of pages4
JournalIEICE Transactions on Information and Systems
VolumeE95-D
Issue number6
DOIs
StatePublished - Jun 2012
Externally publishedYes

Keywords

  • Active learning
  • Defect prediction
  • Machine learning
  • Support vector machine

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