Abstract
An active learning method, called Two-stage Active learning algorithm (TAL), is developed for software defect prediction. Combining the clustering and support vector machine techniques, this method improves the performance of the predictor with less labeling effort. Experiments validate its effectiveness.
| Original language | English |
|---|---|
| Pages (from-to) | 1680-1683 |
| Number of pages | 4 |
| Journal | IEICE Transactions on Information and Systems |
| Volume | E95-D |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2012 |
| Externally published | Yes |
Keywords
- Active learning
- Defect prediction
- Machine learning
- Support vector machine
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