TY - GEN
T1 - Active Discriminant Functions for handwriting recognition
AU - Sun, Guangling
AU - Huang, Jianhua
AU - Tang, Xianglong
PY - 2004
Y1 - 2004
N2 - A novel Active Discriminant Functions (ADFs) for handwriting recognition is presented in this paper. First, statistical feature based deformable model in principal subspace is proposed and a minimum distance between an unknown pattern and the deformable model is given. Second, to improve the accuracy of recognition, the minor subspace is also considered in ADFs. Third, as parameters of the ADFs, the optimal constraints of a deformable model are searched by applying Minimum Classification Error (MCE) criterion. Finally, empirical experiments are conducted on handwritten Chinese characters used in banking and the results show that our proposed ADFs outperform other representative techniques, such as support vector machine, multiplayer perceptron, etc.
AB - A novel Active Discriminant Functions (ADFs) for handwriting recognition is presented in this paper. First, statistical feature based deformable model in principal subspace is proposed and a minimum distance between an unknown pattern and the deformable model is given. Second, to improve the accuracy of recognition, the minor subspace is also considered in ADFs. Third, as parameters of the ADFs, the optimal constraints of a deformable model are searched by applying Minimum Classification Error (MCE) criterion. Finally, empirical experiments are conducted on handwritten Chinese characters used in banking and the results show that our proposed ADFs outperform other representative techniques, such as support vector machine, multiplayer perceptron, etc.
UR - https://www.scopus.com/pages/publications/10044239188
U2 - 10.1109/ICPR.2004.1334320
DO - 10.1109/ICPR.2004.1334320
M3 - 会议稿件
AN - SCOPUS:10044239188
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 602
EP - 605
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -