Skip to main navigation Skip to search Skip to main content

Achieving large uniform tensile elasticity in microfabricated diamond

  • Chaoqun Dang
  • , Jyh Pin Chou
  • , Bing Dai
  • , Chang Ti Chou
  • , Yang Yang
  • , Rong Fan
  • , Weitong Lin
  • , Fanling Meng
  • , Alice Hu*
  • , Jiaqi Zhu*
  • , Jiecai Han
  • , Andrew M. Minor
  • , Ju Li*
  • , Yang Lu*
  • *Corresponding author for this work
  • City University of Hong Kong
  • National Changhua University of Education
  • National Yang Ming Chiao Tung University
  • University of California at Berkeley
  • Southern University of Science and Technology
  • Massachusetts Institute of Technology
  • City University of Hong Kong Shenzhen Research Institute

Research output: Contribution to journalArticlepeer-review

Abstract

Diamond is not only the hardest material in nature, but is also an extreme electronic material with an ultrawide bandgap, exceptional carrier mobilities, and thermal conductivity. Straining diamond can push such extreme figures of merit for device applications. We microfabricated single-crystalline diamond bridge structures with ~1 micrometer length by ~100 nanometer width and achieved samplewide uniform elastic strains under uniaxial tensile loading along the [100], [101], and [111] directions at room temperature. We also demonstrated deep elastic straining of diamond microbridge arrays. The ultralarge, highly controllable elastic strains can fundamentally change the bulk band structures of diamond, including a substantial calculated bandgap reduction as much as ~2 electron volts. Our demonstration highlights the immense application potential of deep elastic strain engineering for photonics, electronics, and quantum information technologies.

Original languageEnglish
Pages (from-to)76-78
Number of pages3
JournalScience
Volume371
Issue number6524
DOIs
StatePublished - 1 Jan 2021

Fingerprint

Dive into the research topics of 'Achieving large uniform tensile elasticity in microfabricated diamond'. Together they form a unique fingerprint.

Cite this