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Accurate determination of pulsed current waveform in plasma immersion ion implantation processes

  • Xiubo Tian*
  • , Baoyin Tang
  • , Paul K. Chu
  • *Corresponding author for this work
  • City University of Hong Kong

Research output: Contribution to journalArticlepeer-review

Abstract

This article reports on the measurement of the ion current in plasma immersion ion implantation. Our simulation results indicate that the total current peaks at the end of rise time of the applied voltage. However, our experimental data acquired using a Rogowski coil and digital oscillator show the highest current at the beginning of the voltage pulse. The discrepancy can be explained by a displacement current attributable to the changing voltage, sheath capacitance, circuit loading effects, as well as secondary electron emission.

Original languageEnglish
Pages (from-to)3567-3570
Number of pages4
JournalJournal of Applied Physics
Volume86
Issue number7
DOIs
StatePublished - 1 Oct 1999
Externally publishedYes

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