TY - GEN
T1 - Accelerated Aging Test and Life Prediction of Rubber Strip for Connector Sealing
AU - Xu, Le
AU - Hu, Ke
AU - Chen, Dongxu
AU - Zhai, Guofu
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - Modeling of aging performance degradation and life prediction are the focus of research in the field of corrosion and protection of polymer materials such as rubber. In order to quickly and accurately predict and evaluate the service life of rubber parts for connector seals at room temperature, this paper conducted constant stress accelerated aging tests on Fluorosilicone O-rings at different temperatures and selected the compressive permanent deformation rate as the degradation characterization quantity. Based on the principle of Arrhenius, the aging life prediction model of rubber at room temperature was established using the kinetic curve linearization method. By analyzing the model, the apparent activation energy was calculated and the service life of rubber parts for connector seals at room temperature was predicted.
AB - Modeling of aging performance degradation and life prediction are the focus of research in the field of corrosion and protection of polymer materials such as rubber. In order to quickly and accurately predict and evaluate the service life of rubber parts for connector seals at room temperature, this paper conducted constant stress accelerated aging tests on Fluorosilicone O-rings at different temperatures and selected the compressive permanent deformation rate as the degradation characterization quantity. Based on the principle of Arrhenius, the aging life prediction model of rubber at room temperature was established using the kinetic curve linearization method. By analyzing the model, the apparent activation energy was calculated and the service life of rubber parts for connector seals at room temperature was predicted.
KW - Accelerated aging test
KW - Apparent activation energy
KW - Life prediction
KW - Relay
KW - Rubber parts for connector seals
UR - https://www.scopus.com/pages/publications/85126188453
U2 - 10.1109/SRSE54209.2021.00039
DO - 10.1109/SRSE54209.2021.00039
M3 - 会议稿件
AN - SCOPUS:85126188453
T3 - Proceedings - 2021 3rd International Conference on System Reliability and Safety Engineering, SRSE 2021
SP - 187
EP - 191
BT - Proceedings - 2021 3rd International Conference on System Reliability and Safety Engineering, SRSE 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd International Conference on System Reliability and Safety Engineering, SRSE 2021
Y2 - 26 November 2021 through 28 November 2021
ER -