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A universal precision positioning equipment in coordinate unified for large scale metrology

  • Deyuan Wang
  • , Wenyan Tang
  • , Xiaolin Zhang
  • , Ma Qiang
  • , Jun Wang
  • , Heyi Sun
  • , Jiang Shao
  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • College of Jilin Railway Vocational and Technical
  • Beijing Satellite Manufacture Factory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this article we describe the design of universal precision positioning equipment and the method to be used in the multi stations coordinate unified of large scale measurements. The system incorporates the concept of distance constrains to control the random error of common points. Measuring each point of the artifacts with the coordinate measuring machine which have higher accurate and obtaining the spatial geometry relationships of them. Used the coordinate data of measurements on site in artifacts to obtain the spatial geometry relationships and compared them with the calibrated relationships. Simultaneously can find the large error of the common points and controlled the error in a set range to achieve the traceability of measurement on site. Then use the common points which satisfied the setting range to transform the coordinate to reference. We get a higher precision coordinate unified with the algorithm of 7 parameters Procrustes. The present method is used in coordinate unified for electronic theodolites and laser tracker. The results show that the accuracy using the artifact is much better than traditional method.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Mechatronics and Automation, ICMA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1761-1766
Number of pages6
ISBN (Electronic)9781479970964
DOIs
StatePublished - 2 Sep 2015
Externally publishedYes
Event12th IEEE International Conference on Mechatronics and Automation, ICMA 2015 - Beijing, China
Duration: 2 Aug 20155 Aug 2015

Publication series

Name2015 IEEE International Conference on Mechatronics and Automation, ICMA 2015

Conference

Conference12th IEEE International Conference on Mechatronics and Automation, ICMA 2015
Country/TerritoryChina
CityBeijing
Period2/08/155/08/15

Keywords

  • algorithm of Procrustes
  • artifact
  • coordinate unified
  • large scale metrology
  • traceability

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