A TPS integrated development environment implementing IEEE1641 and ATML

Liyan Qiao; Zhaoqing Liu; Yu Peng; Xiyuan Peng

doi:10.1109/AUTEST.2009.5314048

A TPS integrated development environment implementing IEEE1641 and ATML

Liyan Qiao^*
, Zhaoqing Liu
, Yu Peng
, Xiyuan Peng

^*Corresponding author for this work

School of Electronics and Information Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.

Original language	English
Title of host publication	IEEE AUTOTESTCON 2009 Proceedings
Pages	246-250
Number of pages	5
DOIs	https://doi.org/10.1109/AUTEST.2009.5314048
State	Published - 2009
Event	IEEE AUTOTESTCON 2009 - Systems Readiness Technology Conference: Mission Assurance Through Advanced ATE - Anaheim, CA, United States Duration: 14 Sep 2009 → 17 Sep 2009

Publication series

Name	AUTOTESTCON (Proceedings)

Conference

Conference	IEEE AUTOTESTCON 2009 - Systems Readiness Technology Conference: Mission Assurance Through Advanced ATE
Country/Territory	United States
City	Anaheim, CA
Period	14/09/09 → 17/09/09

Keywords

ATML
IDE
Signal oriented

Access to Document

10.1109/AUTEST.2009.5314048

Cite this

@inproceedings{eb2815e0738d442abd70f0fd67513aec,

title = "A TPS integrated development environment implementing IEEE1641 and ATML",

abstract = "With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.",

keywords = "ATML, IDE, Signal oriented",

author = "Liyan Qiao and Zhaoqing Liu and Yu Peng and Xiyuan Peng",

year = "2009",

doi = "10.1109/AUTEST.2009.5314048",

language = "英语",

isbn = "9781424449811",

series = "AUTOTESTCON (Proceedings)",

pages = "246--250",

booktitle = "IEEE AUTOTESTCON 2009 Proceedings",

note = "IEEE AUTOTESTCON 2009 - Systems Readiness Technology Conference: Mission Assurance Through Advanced ATE ; Conference date: 14-09-2009 Through 17-09-2009",

}

Qiao, L , Liu, Z , Peng, Y & Peng, X 2009, A TPS integrated development environment implementing IEEE1641 and ATML. in IEEE AUTOTESTCON 2009 Proceedings., 5314048, AUTOTESTCON (Proceedings), pp. 246-250, IEEE AUTOTESTCON 2009 - Systems Readiness Technology Conference: Mission Assurance Through Advanced ATE, Anaheim, CA, United States, 14/09/09. https://doi.org/10.1109/AUTEST.2009.5314048

TY - GEN

T1 - A TPS integrated development environment implementing IEEE1641 and ATML

AU - Qiao, Liyan

AU - Liu, Zhaoqing

AU - Peng, Yu

AU - Peng, Xiyuan

PY - 2009

Y1 - 2009

N2 - With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.

AB - With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.

KW - ATML

KW - IDE

KW - Signal oriented

UR - https://www.scopus.com/pages/publications/72249084923

U2 - 10.1109/AUTEST.2009.5314048

DO - 10.1109/AUTEST.2009.5314048

M3 - 会议稿件

AN - SCOPUS:72249084923

SN - 9781424449811

T3 - AUTOTESTCON (Proceedings)

SP - 246

EP - 250

BT - IEEE AUTOTESTCON 2009 Proceedings

T2 - IEEE AUTOTESTCON 2009 - Systems Readiness Technology Conference: Mission Assurance Through Advanced ATE

Y2 - 14 September 2009 through 17 September 2009

ER -

A TPS integrated development environment implementing IEEE1641 and ATML

Abstract

Publication series

Conference

Keywords

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