TY - GEN
T1 - A testability allocation method based on Analytic Hierarchy Process and comprehensive weighted
AU - Yang, Chunling
AU - Zheng, Yingrong
AU - Zhu, Min
AU - Zuo, Zhenpeng
AU - Chen, Xi
AU - Peng, Xiyuan
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/20
Y1 - 2014/10/20
N2 - Testability allocation is an important process in design for testability, which allocates system-hierarchy testability index hierarchy by hierarchy down to every part of the system. Aiming at the shortage of the existing testability allocation methods, an unconventional allocation method based on Analytic Hierarchy Process (AHP) and comprehensive weighted method is proposed in this paper. On the basis of testability model of system, comprehensive weighted method is used to take use of the influence parameters and weighting coefficients of each unit of the system calculated by Analytic Hierarchy Process to solve allocation values of each unit. Compared with others, this allocation method is simple, requires less calculation and satisfies different demands. This method is applied to a system to verify its validity, the results show that it is able to effectively integrate various influencing factors and reasonably allocate testability index of the system down to units.
AB - Testability allocation is an important process in design for testability, which allocates system-hierarchy testability index hierarchy by hierarchy down to every part of the system. Aiming at the shortage of the existing testability allocation methods, an unconventional allocation method based on Analytic Hierarchy Process (AHP) and comprehensive weighted method is proposed in this paper. On the basis of testability model of system, comprehensive weighted method is used to take use of the influence parameters and weighting coefficients of each unit of the system calculated by Analytic Hierarchy Process to solve allocation values of each unit. Compared with others, this allocation method is simple, requires less calculation and satisfies different demands. This method is applied to a system to verify its validity, the results show that it is able to effectively integrate various influencing factors and reasonably allocate testability index of the system down to units.
KW - Analytic Hierarchy Process
KW - comprehensive weighted method
KW - testability allocation
UR - https://www.scopus.com/pages/publications/84912121125
U2 - 10.1109/ICIEA.2014.6931141
DO - 10.1109/ICIEA.2014.6931141
M3 - 会议稿件
AN - SCOPUS:84912121125
T3 - Proceedings of the 2014 9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014
SP - 113
EP - 116
BT - Proceedings of the 2014 9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014
Y2 - 9 June 2014 through 11 June 2014
ER -