@inproceedings{4adcdf230c6140cc9e44c741d619e9d3,
title = "A soft measurement of small out-line transistor in surface mount technology",
abstract = "The role of machine vision detection technology as the core component in the surface mount technology devices (SMDs) cannot be denied. Single in-line package chip is an important type in IC chips and its leads forms varies a lot. This paper proposes an efficient method to soft measure single in-line package chips position and orientation. Chip image is taken by the industrial camera in the form of gray level and the region of interest (ROI) image is selected. In contour image which is extracted from the binary ROI image to get the precision position, Hough transform is used to locate the ranges of the chips leads on both sides and to calculate the accurate positions of the leads corners. Then the other parameters can be calculated as well. We test the performance of our approach by a mount of images in different light conditions taken from the surface mount system.",
keywords = "Chip detection, Discrete fourier, Hough transform, Image based soft sensor, Small out-line transistorchip, Surface mount technology",
author = "Chao Xu and Lifei Bai and Zhihao Zhang and Boxuan Han",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 ; Conference date: 29-10-2017 Through 01-11-2017",
year = "2017",
month = dec,
day = "15",
doi = "10.1109/IECON.2017.8217198",
language = "英语",
series = "Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "6855--6858",
booktitle = "Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society",
address = "美国",
}