@inproceedings{b7f0abcbf0b945ab97dcb0cbfdc5d67e,
title = "A single event latch-up protection method for SRAM FPGA",
abstract = "The state-of-The-Art SRAM FPGAS show great potentials for aerospace applications because of their high performance, low power consumption and flexible configuration features. However, as typical CMOS devices, SRAM FPGAS are prone to Single Event Latchup(SEL) which may cause permanent damage to the device in the space radiation environment. This paper proposes a restorable anti-SEL method for SRAM FPGAS. The method can immediately disconnect the power supply when SEL occurs and restore power supply after the fault is solved. The experiments results show that the method can accurately detect the occurrence of SEL, and effectively release the SEL. Thus, it can help to improve the stability and reliability of SRAM FPGAS space application.",
keywords = "CMOS structure, FPGA, Overcurrent protection, Single event latchup",
author = "Guo Yue and Wang Shaojun and Ma Ning and Li Pan and Peng Yu",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 13th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2017 ; Conference date: 20-10-2017 Through 22-10-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/ICEMI.2017.8265807",
language = "英语",
series = "ICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "332--336",
editor = "Wu Juan and Yin Jiali and Zhang Qi",
booktitle = "ICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments",
address = "美国",
}