Skip to main navigation Skip to search Skip to main content

A simple and fast spline filtering algorithm for surface metrology

  • Nanjing Forestry University
  • National Institute of Standards and Technology
  • School of Mechatronics Engineering, Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Spline filters and their corresponding robust filters are commonly used filters recommended in ISO (the International Organization for Standardization) standards for surface evaluation. Generally, these linear and non-linear spline filters, composed of symmetric, positive-definite matrices, are solved in an iterative fashion based on a Cholesky decomposition. They have been demonstrated to be relatively efficient, but complicated and inconvenient to implement. A new spline-filter algorithm is proposed by means of the discrete cosine transform or the discrete Fourier transform. The algorithm is conceptually simple and very convenient to implement.

Original languageEnglish
Pages (from-to)129-137
Number of pages9
JournalJournal of Research of the National Institute of Standards and Technology
Volume120
DOIs
StatePublished - 2015
Externally publishedYes

Keywords

  • Discrete cosine transform
  • Discrete fourier transform
  • Spline filter
  • Surface metrology

Fingerprint

Dive into the research topics of 'A simple and fast spline filtering algorithm for surface metrology'. Together they form a unique fingerprint.

Cite this