@inproceedings{893679fbc793428aa823ef445e69011a,
title = "A SEU test and simulation method for Zynq BRAM and flip-flops",
abstract = "Zynq is designed to provide higher overall system performance and programmable flexibility at lower power consumption, which is consistent with the trend of commercial small satellite computers. Although modern commercial Zynq chips offer those aforementioned advantages, On-Chip Block RAM(BRAM) and flip-flops(FF) are susceptible to Single Event Upsets(SEU) in space application. We proposed built-in self-test circuits to test the SEU cross sections of BRAM and FF based on the analysis of the basic structure and application requirements of Zynq. To verify the validity of the self-test circuits, the fault injectors are designed to simulate the SEU at any position in any BRAM and each FF. The design can be used for space-borne and ground heavy ion test of Zynq chips.",
keywords = "Fault injection, SEU, Test method, Zynq",
author = "Ji Yao and Wang Shaojun and Ma Ning and Peng Yu",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 13th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2017 ; Conference date: 20-10-2017 Through 22-10-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/ICEMI.2017.8265693",
language = "英语",
series = "ICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--5",
editor = "Wu Juan and Yin Jiali and Zhang Qi",
booktitle = "ICEMI 2017 - Proceedings of IEEE 13th International Conference on Electronic Measurement and Instruments",
address = "美国",
}