TY - GEN
T1 - A robust quality-related fault detection method for nonlinear processes
AU - Sun, Wei
AU - Wang, Guang
AU - Yin, Shen
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/12
Y1 - 2017/7/12
N2 - Quality-related fault detection method is quite significant for the process industry in recent years. One of the most effective nonlinear quality-related fault detection methods is MKPLS. It can achieve the purpose of monitoring the process performance. However, it is sensitive to outliers. When a certain number of outliers occurs, MKPLS can not work well to build model precisely. To overcome this drawback, this paper proposes a revised version of MKPLS, which can be used in chemical plant for fault detection. The algorithm introduces a spherical strategy to ensure system robustness against outliers. In the fault detection part, the new gained regression coefficient are decomposed thoroughly into quality-related subspace and quality-unrelated subspace. Then, Hotelling's statistic is employed to monitor process. In the case study, a nonlinear numerical case and an industrial process simulator are applied to demonstrate the performance of the proposed method.
AB - Quality-related fault detection method is quite significant for the process industry in recent years. One of the most effective nonlinear quality-related fault detection methods is MKPLS. It can achieve the purpose of monitoring the process performance. However, it is sensitive to outliers. When a certain number of outliers occurs, MKPLS can not work well to build model precisely. To overcome this drawback, this paper proposes a revised version of MKPLS, which can be used in chemical plant for fault detection. The algorithm introduces a spherical strategy to ensure system robustness against outliers. In the fault detection part, the new gained regression coefficient are decomposed thoroughly into quality-related subspace and quality-unrelated subspace. Then, Hotelling's statistic is employed to monitor process. In the case study, a nonlinear numerical case and an industrial process simulator are applied to demonstrate the performance of the proposed method.
KW - Outliers
KW - Quality-related fault detection
KW - Robustness
KW - Spherical strategy
UR - https://www.scopus.com/pages/publications/85028088817
U2 - 10.1109/CCDC.2017.7979239
DO - 10.1109/CCDC.2017.7979239
M3 - 会议稿件
AN - SCOPUS:85028088817
T3 - Proceedings of the 29th Chinese Control and Decision Conference, CCDC 2017
SP - 4215
EP - 4220
BT - Proceedings of the 29th Chinese Control and Decision Conference, CCDC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th Chinese Control and Decision Conference, CCDC 2017
Y2 - 28 May 2017 through 30 May 2017
ER -