@inproceedings{57405924f009446495ed3194492358d9,
title = "A planar pattern based calibration method for high precision structured laser triangulation measurement",
abstract = "A flexible calibration method with high precision was proposed for calibration of structured laser triangulation in the applications of 3D reconstruction and point cloud processing. The camera coordinate system was chosen as the ultimate reference coordinate. In this calibration process, be required only a planar pattern placed at different orientations and positions for obtainment of the camera intrinsic parameters. And then two or more non-coplanar sets of three collinear points were calculated for the laser projection plane coefficients. A line laser triangulation measurement system is established, consisted of laser diode, cylindrical lens module and camera imaging system. Experimental results based on the constructed structured laser triangulation system revealed that accuracy of the profile measurement is less than ±0.005mm, which can meet the majority of industrial inspection applications.",
keywords = "3D reconstruction, Calibration, Laser projector plane, Laser triangulation, Planar pattern",
author = "Ruiming Chen and Xinghui Li and Xiaohao Wang and Jianxiong Li and Gaopeng Xue and Qian Zhou and Kai Ni",
note = "Publisher Copyright: {\textcopyright} 2019 SPIE.; Optical Metrology and Inspection for Industrial Applications VI 2019 ; Conference date: 21-10-2019 Through 23-10-2019",
year = "2019",
doi = "10.1117/12.2537757",
language = "英语",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Sen Han and Sen Han and Toru Yoshizawa and Song Zhang and Benyong Chen",
booktitle = "Optical Metrology and Inspection for Industrial Applications VI",
address = "美国",
}