@inproceedings{ee3dbd18c32e480b90480b7a635312f1,
title = "A Novel Multivariate Statistical Analysis Aided Deep Learning Approach for Nonlinear System Process Monitoring with Comparison Studies",
abstract = "The safety, stability and reliability of the modern complex processes have always been the focus of the industry. An abnormity can lead to failures in the production and manufacturing processes or even dramatic accidents. The fault diagnosis techniques aim to enhance the aforementioned aspects by detecting the system's deviations from the normal operating conditions and providing early warnings. By mining the hidden system features in the historical data, complex physical modeling procedures and the dependence on large amounts of prior knowledge can be avoided. In many practical scenarios, data-driven fault diagnosis algorithms are more suitable for modern industrial diagnosis. In this paper, a novel approach is proposed which integrates both multivariate statistical analysis and deep neural network to deal with the nonlinearities in the complex systems. Based on the theory of traditional data-driven methods, deep learning methods and the newly proposed method, a MATLAB-based fault diagnosis toolbox is developed and published online. Plentiful function libraries are provided to the researchers to analyze those algorithms and satisfy the need of practical industrial applications. By applying the developed toolbox, the characteristics of those algorithms are also compared, especially on the time-consumption feature and the fault discrimination feature.",
keywords = "comparison study, data-driven, nonlinear system, process monitoring, toolbox",
author = "Xueyan Zhao and Yuchen Jiang and Hao Luo and Shen Yin",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020 ; Conference date: 19-10-2020 Through 21-10-2020",
year = "2020",
month = oct,
day = "18",
doi = "10.1109/IECON43393.2020.9255289",
language = "英语",
series = "IECON Proceedings (Industrial Electronics Conference)",
publisher = "IEEE Computer Society",
pages = "2600--2605",
booktitle = "Proceedings - IECON 2020",
address = "美国",
}