@inproceedings{82302f3968624cbe897fa884dd4350b4,
title = "A Novel Modeling Approach of Single Event Transients for Particle Strikes",
abstract = "Single event effects (SEEs) have become an important threat against the reliability of integrated circuits (ICs) for the space application. An accurate prediction of soft error susceptibility is the foundation of hardening design of ICs. This requires a precise model to simulate the current induced from the particle strike. The classic double exponential transient current model designed for estimating the susceptibility of ICs is not suitable for nanoscale technology. In this paper, a composite double exponential transient model, which is consists of a prompt collection current and a sustained collection current, is proposed. The model has been validated using Technology Computer Aided Design (TCAD) simulation, which can be applied to evaluate the sensitivity of circuits and validate the effectiveness of hardening technique.",
author = "Cao, \{Xue Bing\} and Xiao, \{Li Yi\} and Jie Li and Zhang, \{Rong Sheng\} and Li, \{Lin Zhe\} and Wang, \{Jin Xiang\}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 ; Conference date: 31-10-2018 Through 03-11-2018",
year = "2018",
month = dec,
day = "5",
doi = "10.1109/ICSICT.2018.8565037",
language = "英语",
series = "2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Ting-Ao Tang and Fan Ye and Yu-Long Jiang",
booktitle = "2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 - Proceedings",
address = "美国",
}