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A novel method for fabricating dual-continuous pore-ligament porous copper and application in power device packaging

  • Jiahao Liu
  • , Lijin Qiu
  • , Jixi Huang
  • , Dongyang Tian
  • , Hongtao Chen*
  • , Hao Zhao
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • China Electronic Product Reliability and Environmental Testing Research Institute
  • Xiamen University of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Owing to the excellent mechanical, thermal, electrical properties and high specific surface area, porous copper (P-Cu)-based composite solder have attracted growing interest in third-generation semiconductor packaging. This paper proposed a method for preparing P-Cu based on high-temperature reduction and powder sintering. The prepared P-Cu featured a unique dual-continuous pore-ligament structure and excellent wettability for Sn96.5Ag0.3Cu0.5 (SAC305) solder to form P-Cu/SAC305 composite solder. After 30,000 power cycles at a constant junction temperature difference of 80 °C, the turn-on voltage of the SiC device packaged by P-Cu/SAC305 remained stable, and the thermal resistance of the device increased only from 2.40 K/W to 3.04 K/W.

Original languageEnglish
Article number140005
JournalMaterials Letters
Volume407
DOIs
StatePublished - 15 Mar 2026
Externally publishedYes

Keywords

  • Dual-continuous pore-ligament structure
  • Low temperature reflow-high temperature service
  • Porous copper
  • Power cycling
  • Thermal resistance

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