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A novel mechanical degradation mechanism in Ag nanopaste/Au pad interface: Grain boundary diffusion-induced Kirkendall-like voids

  • Yiping Wang
  • , Jiayun Feng*
  • , Zirui Tong
  • , Peng Wu
  • , Runze Wang
  • , Xinyang Ma
  • , Shang Wang
  • , Jianchao Liang
  • , Shuai Jin
  • , Minghan Yu
  • , Yanhong Tian
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

This study reveals a novel degradation mechanism in Ag-Au sintered joints under high-temperature conditions (> 250 °C). Unlike Ag-Ag joints, which exhibit monotonically improving strength with sintering temperature, Ag-Au joints show peak strength at 275 °C/1 h followed by significant degradation. We attribute this anomaly to the formation of abnormally large (up to 1.8 μm) Kirkendall-like voids at the interface. Through multiscale characterization, a three-stage grain boundary diffusion process is identified: (1) grain boundary widening with stacking faults and defects, (2) crystallization into strip-like Ag-rich alloys, and (3) lateral growth consuming Au grains via stacking faults. In addition, a substantial lattice contraction (5.9 %–8.8 %) is quantified in adjacent Au crystals, which is attributed to stress fields from Ag accumulation in grain boundaries (GBs). These findings provide new insights into establishing practical guidelines for pad material selection in high-power packaging.

Original languageEnglish
Pages (from-to)15-25
Number of pages11
JournalJournal of Materials Science and Technology
Volume270
DOIs
StatePublished - 1 Nov 2026

Keywords

  • Kirkendall effect
  • Lattice contraction
  • Nano paste
  • Pore evolution
  • Power electronics packaging

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