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A novel experimental validation method of dynamic X-parameters includes long-term memory effects

  • Yuanxiao Gou*
  • , Jiahui Fu
  • , Maoliu Lin
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A novel experimental validation method for the modeling of amplifier with long-term memory effects of dynamic X-parameters is proposed in this paper. The basic idea of this method is by applying the narrow step signal as stimulus signal to replace the classical two-tone measurements. The comparison results between the measured and the measurement-based model have a perfect agreement, and it proves the validity of theory.

Original languageEnglish
Title of host publicationCPEM 2014 - 29th Conference on Precision Electromagnetic Measurements, Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages572-573
Number of pages2
ISBN (Electronic)9781479952052
DOIs
StatePublished - 12 Sep 2014
Event29th Conference on Precision Electromagnetic Measurements, CPEM 2014 - Rio de Janeiro, Brazil
Duration: 24 Aug 201429 Aug 2014

Publication series

NameCPEM Digest (Conference on Precision Electromagnetic Measurements)
ISSN (Print)0589-1485

Conference

Conference29th Conference on Precision Electromagnetic Measurements, CPEM 2014
Country/TerritoryBrazil
CityRio de Janeiro
Period24/08/1429/08/14

Keywords

  • Behavioral model
  • Dynamic X-parameters
  • long-term memory effects
  • narrow step signal

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