TY - GEN
T1 - A novel approach for incipient fault detection in analog circuits
AU - Yu, Yang
AU - Jiang, Yueming
AU - Wang, Hetong
AU - Peng, Xiyuan
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7
Y1 - 2018/7
N2 - A novel approach for incipient fault detection in analog circuit is presented in this paper. A testing stimulus generating method has been proposed, based on statistical distribution characteristic of response signal for both normal state and fault state, using compactness index to indicate the deviation between the incipient fault state and normal state, so the test stimulus, which can furthest stimulate the weak fault features of incipient faults can be selected according to the compactness measuring algorithm. After using wavelet transform to the response signal, for fault feature extraction, one-class classifier Support Vector Data Description (SVDD) has been used as fault classifier for fault detection. The proposed method has been verified by experiment results, and proved to be effective especially on the incipient fault of analog circuits.
AB - A novel approach for incipient fault detection in analog circuit is presented in this paper. A testing stimulus generating method has been proposed, based on statistical distribution characteristic of response signal for both normal state and fault state, using compactness index to indicate the deviation between the incipient fault state and normal state, so the test stimulus, which can furthest stimulate the weak fault features of incipient faults can be selected according to the compactness measuring algorithm. After using wavelet transform to the response signal, for fault feature extraction, one-class classifier Support Vector Data Description (SVDD) has been used as fault classifier for fault detection. The proposed method has been verified by experiment results, and proved to be effective especially on the incipient fault of analog circuits.
KW - Compactness index
KW - Fault detection
KW - Support vector data description
KW - Test stimulus generation
UR - https://www.scopus.com/pages/publications/85083490207
U2 - 10.1109/IMCCC.2018.00068
DO - 10.1109/IMCCC.2018.00068
M3 - 会议稿件
AN - SCOPUS:85083490207
T3 - Proceedings - 8th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2018
SP - 289
EP - 294
BT - Proceedings - 8th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2018
A2 - Li, Jun-Bao
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on Instrumentation and Measurement, Computer, Communication and Control, IMCCC 2018
Y2 - 19 July 2018 through 21 July 2018
ER -