@inproceedings{1698e707a0fd479093b7579c159dbf1e,
title = "A new active IC metering technique based on locking scan cells",
abstract = "In this paper, we propose a new external active metering technique. Physical unclonable function (PUF) is used to generate a unique key for each IC. The PUF key is encrypted by public-key cryptography (PKC) algorithm and passed to the design house for decryption with private key. Only when the foundry inputs correct key into the design, can the design be unlocked and work normally. A new locking scheme is implemented by controlling the working mode of some specific scan cells in scan chain. Such locking scheme will not affect the timing of the functional path. Also, this metering method allows multiple input of key friendly. After the first successful activation, the unlocking circuitry will not function any more, which overcomes the weakness of multiple queries of correct key from design house due to the variation of PUF key with environmental change or aging. The metering method just incurs acceptably low area overhead and no compromise of testability. It can resist typical attacks.",
keywords = "IC metering, Overbuilding, Piracy, Scan cells",
author = "Aijiao Cui and Xuesen Qian and Gang Qu and Huawei Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 26th IEEE Asian Test Symposium, ATS 2017 ; Conference date: 27-11-2017 Through 30-11-2017",
year = "2018",
month = jan,
day = "24",
doi = "10.1109/ATS.2017.20",
language = "英语",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "36--41",
booktitle = "Proceedings - 2017 IEEE 26th Asian Test Symposium, ATS 2017",
address = "美国",
}