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A multi-release reliability model of open source software with fault detection obeying three-parameter lifetime distribution

  • Jinyong Wang*
  • , Pengda Li
  • , Jiaxuan Hu
  • , Ce Zhang
  • *Corresponding author for this work
  • Shanxi University
  • School of Computer Science and Technology (School of Software), Harbin Institute of Technology Weihai

Research output: Contribution to journalArticlepeer-review

Abstract

With the development of open source software (OSS), software reliability has become an important issue. Due to the complexity of OSS development and testing environment, the fault detection rate of OSS will show a variety of changes. The existing OSS reliability models cannot fully adapt to the complex changes of OSS fault detection. In this paper, we proposed a multi-release OSS reliability model based on three-parameter lifetime distribution. The proposed model can effectively adapt to the complicated changes of fault detection in the processes of development and testing of OSS. Experimental results indicate that the proposed model has the better fitting and predictive performance compared with other multi-release OSS reliability models. Moreover, the proposed model can better adapt to the variety of OSS fault detection environment, and assist developers to evaluate the reliability of OSS.

Original languageEnglish
Article number19576
JournalScientific Reports
Volume14
Issue number1
DOIs
StatePublished - Dec 2024
Externally publishedYes

Keywords

  • Fault detection
  • Multi-release reliability model
  • Open source software
  • Three-parameter lifetime distribution

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