@inproceedings{b7078c9aeb4746a9ba1f1966679eeece,
title = "A method to estimate cross-section of circuits at RTL levels",
abstract = "This paper proposed a method to estimate cross-section of circuits at RTL level design. By combination of the intrinsic cross-section which was obtain from Monte-Carlo simulation with the results obtained from fault injection, the method can provide systematic dynamic cross-section of the design. It can be an alternative method instead of ground radiation test to get cross section. The DDC IP Core has been simulated for test. The results showed that dynamic cross-section is smaller than static cross-section in certain application. The saturated dynamic cross-section of it is about 5e-3 cm2/device.",
author = "Liyi Xiao and Anlong Li and Xuebing Cao and Hongchen Li and Rongsheng Zhang and Jie Li and Tianqi Wang",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017 ; Conference date: 25-10-2017 Through 28-10-2017",
year = "2017",
month = jul,
day = "1",
doi = "10.1109/ASICON.2017.8252488",
language = "英语",
series = "Proceedings of International Conference on ASIC",
publisher = "IEEE Computer Society",
pages = "363--366",
editor = "Yajie Qin and Zhiliang Hong and Ting-Ao Tang",
booktitle = "Proceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017",
address = "美国",
}