TY - GEN
T1 - A low power deterministic test pattern generator for BIST based on cellular automata
AU - Cao, Bei
AU - Xiao, Liyi
AU - Wang, Yongsheng
PY - 2008
Y1 - 2008
N2 - The test pattern generator (TPG) in deterministic BIST often suffers from some problems such as extra test power consumption, area overhead and idle test cycles. In this paper, an efficient algorithm is proposed to synthesize a built-in TPG from low power deterministic test patterns without inserting any redundancy test vectors. The structure of TPG is based on the non-uniform cellular automata (CA) and is used to test combinational circuits. And the algorithm is based on the nearest neighborhood model, which can find an optimal non-uniform CA topology to generate given low power test patterns. Simulation results using benchmark combinational circuits show that the generator is efficient to generate the deterministic test patterns in terms of power consumption, area overhead and test time.
AB - The test pattern generator (TPG) in deterministic BIST often suffers from some problems such as extra test power consumption, area overhead and idle test cycles. In this paper, an efficient algorithm is proposed to synthesize a built-in TPG from low power deterministic test patterns without inserting any redundancy test vectors. The structure of TPG is based on the non-uniform cellular automata (CA) and is used to test combinational circuits. And the algorithm is based on the nearest neighborhood model, which can find an optimal non-uniform CA topology to generate given low power test patterns. Simulation results using benchmark combinational circuits show that the generator is efficient to generate the deterministic test patterns in terms of power consumption, area overhead and test time.
UR - https://www.scopus.com/pages/publications/50649125235
U2 - 10.1109/DELTA.2008.65
DO - 10.1109/DELTA.2008.65
M3 - 会议稿件
AN - SCOPUS:50649125235
SN - 0769531105
SN - 9780769531106
T3 - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
SP - 266
EP - 269
BT - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
T2 - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Y2 - 23 January 2008 through 25 January 2008
ER -