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A low-overhead dynamic watermarking scheme on scan design for easy authentication

  • Harbin Institute of Technology Shenzhen
  • Hu Nan University of Science and Technology
  • University of Maryland, College Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes a new dynamic watermarking scheme during the Design-for-Testability (DfT) stage. The extra design constraints due to watermark are imposed on the connection styles between some scan cells. As the scan chain order is maintained, no routing overhead is caused. It thus overcomes the weakness of the watermarking schemes based on scan chain reordering, which usually incur unpredicted long routing or even congestion during physical design. Most of the performances are not compromised. Experimental results show that only negligible overhead on test power is caused while a strong authorship proof is achieved.

Original languageEnglish
Title of host publication2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages778-781
Number of pages4
ISBN (Print)9781479934324
DOIs
StatePublished - 2014
Externally publishedYes
Event2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 - Melbourne, VIC, Australia
Duration: 1 Jun 20145 Jun 2014

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014
Country/TerritoryAustralia
CityMelbourne, VIC
Period1/06/145/06/14

Keywords

  • Dynamic watermarking
  • Low overhead
  • Scan design

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