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A high-g overload protected accelerometer with a novel microstructure

  • Weiping Chen*
  • , Wei Wang
  • , Lei Tian
  • , Xiaowei Liu
  • , Mingxue Huo
  • , Ruichao Zhang
  • , Deyin Zhang
  • *Corresponding author for this work
  • China Electronics Technology Group Corporation
  • Harbin Institute of Technology

Research output: Contribution to journalConference articlepeer-review

Abstract

A high-g overload protected piezoresistive accelerometer with the cave form section and two-end-fixed beams was introduced in this paper. Based on the finite element method (FEM) simulation, an optimal design of the microstructure was presented. The accelerometer was fabricated by standard IC process, ICP plasma etching and silicon anodic bonding technique. The testing results show that the accelerometer can bear 20,000g shock, the non-linearity reaches to 0.5% in the ±50g full scale, sensitivity reaches 0.8mV/g, and the operation frequency range is from DC to 2kHz.

Original languageEnglish
Article number26
Pages (from-to)82-86
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5641
DOIs
StatePublished - 2004
EventMEMS/MOEMS Technologies and Applications II - Beijing, China
Duration: 10 Nov 200412 Nov 2004

Keywords

  • Accelerometer
  • FEM
  • Overload
  • Piezoresistor

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