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A Free Reflection Surface Based on Zernike Polynomial for Passive Millimeter Wave Imaging

  • Pengcheng Wang
  • , Nannan Wang
  • , Xueying Wang
  • , Oleksandr Denisov
  • , Qian Song
  • , Jinghui Qiu
  • School of Electronics and Information Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the impact of the imaging system's focus characteristics. Passive millimeter wave imaging systems often use focal plane arrays and ellipsoidal reflective surfaces. The ellipsoid reflecting surface will cause focal spot distortion during the offset feed, which will adversely affect the resolution of the imaging system. To solve this problem, based on the W-band passive millimeter wave imaging system, this paper combines optical imaging theory and millimeter wave imaging theory to design a free-form surface based on Zernike polynomial to improve focal spot distortion. Using Zernike surface in this system, the resolution accuracy is increased by 29mm when the offset is 3.6°, and the resolution accuracy is increased by 11mm when the offset is 6.9°.

Original languageEnglish
Title of host publication2021 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665434379
DOIs
StatePublished - 2021
Externally publishedYes
Event13th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Nanjing, China
Duration: 23 May 202126 May 2021

Publication series

Name2021 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021 - Proceedings

Conference

Conference13th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2021
Country/TerritoryChina
CityNanjing
Period23/05/2126/05/21

Keywords

  • feed
  • freeform surface
  • passive millimeter wave imaging
  • zernike polynomial

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