@inproceedings{80c7c0428ffe4bd69deb78497cbcc779,
title = "A fast and accurate fault injection platform for SRAM-based FPGAs",
abstract = "SRAM-based FPGAs have a wide application in space because of the reconfigurability and high-capacity. However, single event upset (SEU) induced by cosmic ray which can induce an error function of user design in FPGA seriously imperils the safety of their applications in space. So evaluating the sensitivity to SEU of user design in FPGA becomes very important. This paper proposed a fast and accurate fault injection platform to evaluate the sensitivity to SEU of user design in FPGA. An optimized address generator was designed for the proposed fault injection platform that can speed up the fault injection and make the results of fault injection more accurate. We tested the fault injection platform with some ISCAS85 benchmark circuits.",
keywords = "Fault injection, SEU, SRAM-based FPGA",
author = "Rongsheng Zhang and Liyi Xiao and Jie Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017 ; Conference date: 25-10-2017 Through 28-10-2017",
year = "2017",
month = jul,
day = "1",
doi = "10.1109/ASICON.2017.8252487",
language = "英语",
series = "Proceedings of International Conference on ASIC",
publisher = "IEEE Computer Society",
pages = "359--362",
editor = "Yajie Qin and Zhiliang Hong and Ting-Ao Tang",
booktitle = "Proceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017",
address = "美国",
}