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A displacement measuring system based on grating double Diffraction

  • Bo Zhao
  • , Lei Wang*
  • , Min Er Xu
  • , Hong Zhao
  • , Xiang Dong Liu
  • *Corresponding author for this work
  • Shanghai Institute of Satellite Engineering
  • China Aerospace Science and Industry Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A displacement measuring system based on grating double diffraction is proposed in this paper to eliminate the impact of multiple reflections of the zero-order diffraction beam and to reduce the stray light coming from the interference field. The principle of the proposed system is that with the proper interference of the first order beam of second diffraction, a displacement transducer can be obtained via the Doppler frequency shift and phase decoding. Simulation tests are conducted using Light Tools model to prove the effectiveness of the proposed system. And experiment results shows that a resolution of 20 nm can be achieved over a range of 25 mm. It is therefore concluded that the proposed system can be used to improve the measurement resolution and accuracy.

Original languageEnglish
Title of host publicationNinth International Symposium on Precision Engineering Measurements and Instrumentation
EditorsXianfang Wen, Jiubin Tan
PublisherSPIE
ISBN (Electronic)9781628415612
DOIs
StatePublished - 2015
Event9th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2014 - Changsha, China
Duration: 8 Aug 201410 Aug 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9446
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference9th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2014
Country/TerritoryChina
CityChangsha
Period8/08/1410/08/14

Keywords

  • Displacement measuring
  • Grating double diffraction
  • Interference
  • Second diffraction

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