A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

You Wang; Ying Shun Li; Rui Song; Jing Shu Shen; Cheng Fen Long

A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

You Wang
, Ying Shun Li
, Rui Song
, Jing Shu Shen^*
, Cheng Fen Long

^*Corresponding author for this work

School of Materials Science and Engineering

CAS - Institute of Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

The morphology of poly (styrene-ethylene/butylene-styrene) (SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy (AFM) with transmission electronics microscopy (TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.

Original language	English
Pages (from-to)	1941-1942
Number of pages	2
Journal	Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities
Volume	22
Issue number	11
State	Published - Nov 2001

Keywords

AFM
Microphase separation
Morphology
TEM

Cite this

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title = "A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy",

abstract = "The morphology of poly (styrene-ethylene/butylene-styrene) (SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy (AFM) with transmission electronics microscopy (TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.",

keywords = "AFM, Microphase separation, Morphology, TEM",

author = "You Wang and Li, \{Ying Shun\} and Rui Song and Shen, \{Jing Shu\} and Long, \{Cheng Fen\}",

year = "2001",

month = nov,

language = "英语",

volume = "22",

pages = "1941--1942",

journal = "Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities",

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publisher = "Higher Education Press Limited Company",

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T1 - A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

AU - Wang, You

AU - Li, Ying Shun

AU - Song, Rui

AU - Shen, Jing Shu

AU - Long, Cheng Fen

PY - 2001/11

Y1 - 2001/11

N2 - The morphology of poly (styrene-ethylene/butylene-styrene) (SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy (AFM) with transmission electronics microscopy (TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.

AB - The morphology of poly (styrene-ethylene/butylene-styrene) (SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy (AFM) with transmission electronics microscopy (TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.

KW - AFM

KW - Microphase separation

KW - Morphology

KW - TEM

UR - https://www.scopus.com/pages/publications/0035507132

M3 - 文章

AN - SCOPUS:0035507132

SN - 0251-0790

VL - 22

SP - 1941

EP - 1942

JO - Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities

JF - Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities

IS - 11

ER -

A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

Abstract

Keywords

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