@inproceedings{6ebe547d9c7b4443936218623bacc5d6,
title = "A 13T radiation-hardened memory cell for low-voltage operation and ultra-low power space applications",
abstract = "This paper presents a novel memory cell design as a variant of Lior Atias' 13T cell (mentioned as LA13T cell in this paper) for low-voltage operation and ultra-low power space applications. Using C-element as a replacement of dual-driven inverters in the LA13T cell, our proposed radiation hardened by design memory cell (referred to as RHD13T) can effectively block the unwanted paths from Vdd to Gnd during SEU occurrence, while the problem will be appeared on LA13T cell. Simulation results show that, at the expense of an increased area for obtaining the same drive capability as LA13T cell at each internal store node, RHD13T cell shows better power consumption than LA13T cell during SET occurrence.",
keywords = "Low Voltage, Radiation Hardened Memory, Reliability, Single-Event Upset (SEU), Ultra-low Power",
author = "Chunhua Qi and Liyi Xiao and Mingxue Huo and Tianqi Wang and Rongsheng Zhang and Xuebing Cao",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 18th International Symposium on Quality Electronic Design, ISQED 2017 ; Conference date: 14-03-2017 Through 15-03-2017",
year = "2017",
month = may,
day = "2",
doi = "10.1109/ISQED.2017.7918310",
language = "英语",
series = "Proceedings - International Symposium on Quality Electronic Design, ISQED",
publisher = "IEEE Computer Society",
pages = "161--165",
booktitle = "Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017",
address = "美国",
}